Mean secondary electron yield of avalanche electrons in the channels of a microchannel plate detector
نویسندگان
چکیده
By modeling the statistical evolution of an avalanche created by 20 keV protons impacting the input surface of a z-stack microchannel plate ~MCP! detector, the mean secondary electron yield gC of avalanche electrons propagating through a MCP channel is measured to equal 1.37 for 760 V per MCP in the z stack. This value agrees with other studies that used MCP gain measurements to infer gC . The technique described here to measure gC is independent of gain saturation effects and simplifying assumptions used in the segmented dynode model, both of which can introduce errors when inferring gC through gain measurements. © 1996 American Institute of Physics. @S0034-6748~96!02110-7#
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